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Spotlight
New Digital Options for X-Series Test Systems
LTX-Credence recently introduced two new FX digital options for the X-Series – the FX2 and FX-HS digital subsystems. Both enhance the ability of the X-Series to provide cost-optimized test solutions for the full range of consumer and mobility devices.
FX2 doubles the digital pin count per instrument as current FX1 digital subsystems, resulting in lower cost per pin and twice the pin count. FX-HS provides a powerful combination of hardware and software features targeted at high speed IOs in next generation consumer and mobility devices.
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News
June 3, 2009
LTX-Credence Announces Third Quarter Results
June 2, 2009
LTX-Credence Announces Diamond Selected as Preferred Platform By Silicon Turnkey Solutions (STS)
STS to use Diamond to lower test costs for devices produced by fabless and IDM customers
March 3, 2009
LTX-Credence and Spirox Integrate Field Operations Organization
Local field operations in Taiwan and China streamlined to better service customers